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Reliability and radiation effects in compound semiconductors

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Bibliographic Details
Main Author: Johnston, Allan (Allan H.)  
Format: Book
Language:English
Published: Singapore : World Scientific, 2010
Genre/form:monografie
ISBN:978-981-4277-10-5
981-4277-10-X
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Physical Description:xii, 363 s. : il.
Bibliography:Obsahuje bibliografie a rejstřík