Scanning electron microscopy : physics of image formation and microanalysis
Uloženo v:
| Hlavní autor: | |
|---|---|
| Médium: | Kniha |
| Jazyk: | angličtina |
| Vydáno: |
Berlin ; New York :
Springer,
1998
|
| Edice: | Springer series in optical sciences
|
| Žánr/forma: | monografie |
| ISBN: | 3-540-63976-4 |
| Témata: | |
| Tagy: |
Přidat tag
Žádné tagy, Buďte první, kdo otaguje tento záznam!
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| LEADER | 01008cam a22002774a 4500 | ||
|---|---|---|---|
| 001 | 000940119 | ||
| 003 | CZ PrICT | ||
| 005 | 20100630124415.0 | ||
| 007 | ta | ||
| 008 | 980605s1998 gw a f b |001 0 eng d | ||
| 020 | |a 3-540-63976-4 | ||
| 035 | |a (DLC) 98026178 | ||
| 040 | |a DLC |b cze |c DLC |d DLC |d ABD025 | ||
| 050 | 0 | 0 | |a QH212.S3 |b R452 1998 |
| 100 | 1 | |a Reimer, Ludwig |4 aut | |
| 245 | 1 | 0 | |a Scanning electron microscopy : |b physics of image formation and microanalysis / |c Ludwig Reimer |
| 250 | |a 2nd completely rev. and updated ed. | ||
| 260 | |a Berlin ; |b Springer, |c c1998 |a New York : | ||
| 300 | |a xiv, 527 s. : |b il. ; |c 24 cm | ||
| 490 | 1 | |a Springer series in optical sciences ; |v v. 45 | |
| 504 | |a Includes bibliographical references and index | ||
| 655 | 7 | |a monografie |7 fd132842 |2 czenas | |
| 650 | 0 | 7 | |a elektronová mikroskopie |x ch |7 psh5680 |2 psh |
| 830 | 0 | |a Springer series in optical sciences | |
| 910 | |a ABD025 | ||
| 996 | |a VSCHT |b 3198070651 |c 10000621 |d 20100630 |f 3256.00 |g V 10-424 |l 107 ÚSK |s Gedeon, Ondrej |t 24 | ||