IEEE design & test

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Previous Title: IEEE design & test of computers (ISSN: 0740-7475)
Corporate Authors: IEEE Council on Electronic Design Automation, IEEE Circuits and Systems Society
Format: Journal
Language:English
Published: New York : Institute of Electrical and Electronics Engineers, 2013
Genre/form:časopisy
ISSN:2168-2356
2168-2364
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Odběr tištěné verze ukončen v r. 2014. Od r. 2015 pouze on-line.

Status Sublibrary Description Location LCC Callnumber Old Callnumber
Open stacks; for loan  Services NTK collection Vol.31:no.1-6(2014) 3rd floor, shelf 3A/024 TK7885 .A1 I338 v.31 no.1-6 R 13381/34
Open stacks; for loan  Services NTK collection Vol.30:no.1-3(2013) 3rd floor, shelf 3A/024 TK7885 .A1 I338 v.30 no.1-3 R 13381/32
Open stacks; for loan  Services NTK collection Vol.30:no.4-6(2013) 3rd floor, shelf 3A/024 TK7885 .A1 I338 v.30 no.4-6 R 13381/33